Zhang, You Hong; Treves, Aldo; Celotti, Annalisa; Qin, Y.P.; Bai, J.M.
(IOP Publishing, 2005-08-20)
Starting from XMM-Newton EPIC-PN data, we present the X-ray variability
characteristics of PKS 2155-304 using a simple analysis of the excess variance,
\xs, and of the fractional rms variability amplitude, fvar. The ...
