Kondra, Shripad; Laishram, Jummi; Ban, Jelena; Migliorini, Elisa; Di Foggia, Valentina; Lazzarino, Marco; Torre, Vincent; Ruaro, Maria Elisabetta
(Elsevier, 2009-02)
Atomic force microscopy (AFM) provides the possibility to map the 3D structure of viewed objects with a nanometric resolution, which cannot be achieved with other imaging methods such as conventional video imaging and ...